Steady flow in an aneurysm model: Correlation between fluid dynamics and blood platelet deposition
Document Type
Article
Publication Date
1-1-1996
Department
Mechanical Engineering
Abstract
Laminar and turbulent numerical simulations of steady flow in an aneurysm model were carried out over Reynolds numbers ranging from 300 to 3600. The numerical simulations are validated with Digital Particle Image Velocimetry (DPIV) measurements, and used to study the fluid dynamic mechanisms that characterize aneurysm deterioration, by correlating them to in vitro blood platelet deposition results. It is shown that the recirculation zone formed inside the aneurysm cavity creates conditions that promote thrombus formation and the viability of rupture. Wall shear stress values in the recirculation zone are around one order of magnitude less than in the entrance zone. The point of reattachment at the distal end of the aneurysm is characterized by a pronounced wall shear stress peak. As the Reynolds number increases in laminar flow, the center of the recirculation region migrates toward the distal end of the aneurysm, increasing the pressure at the reattachment point. Under fully turbulent flow conditions (Re = 3600) the recirculation zone inside the aneurysm shrinks considerably. The wall shear stress values are almost one order of magnitude larger than those for the laminar cases. The fluid dynamics mechanisms inferred from the numerical simulation were correlated with measurements of blood platelet deposition, offering useful explanations for the different morphologies of the platelet deposition curves. © 1996 by ASME.
DOI
10.1115/1.2796008
First Page
280
Last Page
286
Publication Title
Journal of Biomechanical Engineering
Recommended Citation
Bluestein, D., Niu, L., Schoephoerster, R. T., and Dewanjee, M. K. (1996). Steady flow in an Aneurysm Model: Correlation between fluid dynamics and blood platelet deposition. ASME. Journal of Biomechanical Engineering 118(3): 280–286. https://doi.org/10.1115/1.2796008.
Comments
At the time of publication, Richard T. Schoephoerster was affiliated with Florida International University.